Buch

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Übersicht

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Verlag	:	Springer International Publishing
Buchreihe	:	Integrated Circuits and Systems
Sprache	:	Englisch
Erschienen	:	24. 05. 2018
Seiten	:	266
Einband	:	Gebunden
Höhe	:	235 mm
Breite	:	155 mm
ISBN	:	9783319779935
Sprache	:	Englisch

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Autorinformation

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Gaudenzio Meneghesso is full professor at the University of Padova, Department of Information engineering. His research interests involve electrical characterization, modeling and reliability of semiconductors devices.  Matteo Meneghini is researcher at the University of Padova, Department of Information engineering. His research interests involve electrical characterization, modeling and reliability of semiconductors devices.  Enrico Zanoni is full professor at the University of Padova, Department of Information engineering. His research interests involve electrical characterization, modeling and reliability of semiconductors devices. 

Inhaltsverzeichnis

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Chapter1: Taking the next step in GaN: bulk GaN substrates and GaN-on-Si epitaxy for electronics.- Chapter2: Lateral GaN HEMT structures.- Chapter3: Vertical GaN Transistors for Power Electronics.- Chapter4: Reliability of GaN-based Power devices.- Chapter5: Validating GaN robustness.- Chapter6: Impact of Parasitics on GaN Based Power Conversion.- Chapter7: GaN in AC/DC Power Converters.- Chapter8: GaN in Switched Mode Power Amplifiers.

Deine Buchhandlung

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