Buch
Retroreflex Ellipsometry for Nonplanar Surfaces
Chia-Wei Chen
Übersicht
Verlag | : | KIT Scientific Publishing |
Buchreihe | : | Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung (Bd. 24) |
Sprache | : | Englisch |
Erschienen | : | 29. 04. 2025 |
Seiten | : | 210 |
Einband | : | Kartoniert |
Höhe | : | 210 mm |
Breite | : | 148 mm |
Gewicht | : | 400 g |
ISBN | : | 9783731514022 |
Sprache | : | Englisch |
Illustrationen | : | graph. Darst. |
Produktinformation
Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.