Buch

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Übersicht

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Verlag	:	Wiley-VCH
Sprache	:	Englisch
Erschienen	:	24. 05. 2005
Seiten	:	432
Einband	:	Gebunden
Höhe	:	240 mm
Breite	:	170 mm
Gewicht	:	946 g
Dicke	:	25 mm
ISBN	:	9783527312825
Sprache	:	Englisch

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Autorinformation

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Born in 1948, José Broekaert studied chemistry at the University of Gent, Belgium, graduating in 1970. After receiving his PhD from the University of Gent in 1976 and a stay in Germany as Alexander-von-Humboldt postdoctoral fellow the following year, he was a scientist at the ISAS, Dortmund from 1978 to 1991 and obtained the degree of "Geaggregeerde voor het hoger onderwijs" from the University of Antwerp, Belgium in 1985. He became associate professor at the University of Dortmund in 1991, full professor at the University of Leipzig in 1998 and, in 2002, joined the University of Hamburg. In 1998 he was a visiting Fulbright research scholar at Indiana University, Bloomington, USA. His main research interests include the development of plasma optical emission, atomic absorption and inorganic mass spectrometry methods and their application in solving analytical problems.

Produktinformation

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This completely revised second edition of the standard work has been expanded by some twenty percent to include more information on the latest developments and new apparatus. In particular, sections have been added on microplasmas and new types of spectrometers, while that on the rapidly expanding field of speciations with practical examples from life and environmental sciences have been included. Still in one handy volume, the book covers all the important modern aspects of atomic fluorescence, emission and absorption spectroscopy as well as plasma mass spectroscopy in a readily comprehensible and practice-oriented manner. A thorough explanation of the physical, theoretical and technical basics, example applications including the concrete execution of analysis and comprehensive cross-references to the latest literature allow even newcomers easy access to the methodologies described.

Inhaltsverzeichnis

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BASIC PRINCIPLESAtomic structurePlasmasEmission and absorption of radiation IonizationDissociationSources for atomic spectrometryAnalytical atomic spectrometrySPECTROMETRIC INSTRUMENTATIONFigures of merit of an analytical methodOptical spectrometersMass spectrometersData acquisition and treatmentTraceabilitySAMPLE INTRODUCTION DEVICESPneumatic nebulizationUltrasonic nebulizationHydride generationEletrothermal evaporationDirect solids samplingCathodic sputteringATOMIC ABSORPTION SPECTROMETRYPrinciplesAtomic absorption spectrometersFlame atomic absorptionElectrothermal atomic absorptionHydride generationBackground correction techniquesFields of applicationATOMIC EMISSION SPECTROMETRYPrinciplesAtomic emission spectrometersFlame emissionArcs and sparksPlasma sourcesGlow dischargesLaser sourcesFields of applicationPLASMA MASS SPECTROMETRYPrinciplesInstrumentationGlow discharge mass spectrometryICP mass spectrometryFields of applicationATOMIC FLUORESCENCE SPECTROMETRYPrinciplesFigures of meritLASER ENHANCED IONIZATION SPECTROMETRYPrinciplesFigures of meritCOMPARISON WITH OTHER METHODSPower of detectionReliabilityEconomic aspects

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